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Browsing by Subject Vt retention distribution

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Issue DateTitleAuthor(s)
2016電阻式記憶體及SONOS快閃式記憶體中介電層缺陷造成之可靠度效應研究鍾岳庭; 汪大暉; Chung, Yueh-Ting; Wang, Tahui; 電子工程學系 電子研究所
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