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Browsing by Subject Wafer Defect Patterns

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Issue DateTitleAuthor(s)
2017利用不平衡資料取樣策略改善晶圓缺陷群聚分類模型李岡峯; 唐麗英; 洪瑞雲; Lee,Gang-Fong; Tong, Lee-Ing; Horng, Ruey-Yun; 工業工程與管理系所
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