瀏覽 的方式： 作者 CHANG, TE
顯示 1 到 5 筆資料，總共 5 筆
| 公開日期 | 標題 | 作者 |
| 1-九月-1994 | EFFECTS OF HOT-CARRIER-INDUCED INTERFACE STATE GENERATION IN SUBMICRON LDD MOSFETS | WANG, TH; HUANG, CM; CHOU, PC; CHUNG, SSS; CHANG, TE; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics |
| 1994 | INTERFACE TRAP INDUCED THERMIONIC AND FIELD EMISSION CURRENT IN OFF-STATE MOSFETS | WANG, TH; CHANG, TE; HUANG, CM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-十二月-1994 | INTERFACE-TRAP EFFECT ON GATE INDUCED DRAIN LEAKAGE CURRENT IN SUBMICRON N-MOSFETS | WANG, TH; HUANG, CM; CHANG, TE; CHOU, JW; CHANG, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-四月-1995 | MECHANISMS OF INTERFACE TRAP-INDUCED DRAIN LEAKAGE CURRENT IN OFF-STATE N-MOSFETS | CHANG, TE; HUANG, CM; WANG, TH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-十二月-1995 | STRUCTURAL EFFECT ON BAND-TRAP-BAND TUNNELING INDUCED DRAIN LEAKAGE IN N-MOSFETS | WANG, TH; CHANG, TE; HUANG, CM; YANG, JY; CHANG, KM; CHIANG, LP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
