瀏覽 的方式： 作者 Chang, MN
顯示 1 到 8 筆資料，總共 8 筆
| 公開日期 | 標題 | 作者 |
| 2004 | Influence of annealing sequence on p(+)/n junction images studied by scanning capacitance microscopy | Chang, MN; Wan, WW; Chen, CY; Lai, JH; Liang, JH; Pan, FM; 材料科學與工程學系; Department of Materials Science and Engineering |
| 2005 | Investigation of localized breakdown spots in thin SiO(2) using scanning capacitance microscopy | Wang, SD; Chang, MN; Chen, CY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-九月-2001 | An investigation of scanning capacitance microscopy on iron-contaminated p-type silicon | Chang, MN; Chang, TY; Pan, FM; Wu, BW; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-八月-2002 | Observation of differential capacitance images on slightly iron-contaminated p-type silicon | Chang, MN; Chen, CY; Pan, FM; Chang, TY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2005 | Observation of localized breakdown spots in thin SiO2 films using scanning capacitance microscopy | Wang, SD; Chang, MN; Chen, CY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-五月-1997 | Porous silicon light-emitting diode with tunable color | Chen, YA; Chen, BF; Tsay, WC; Laih, LH; Chang, MN; Chyi, JI; Hong, JW; Chang, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-2004 | Selective growth of carbon nanotube on scanning probe tips by microwave plasma chemical vapor deposition | Pan, FM; Liu, YB; Chang, Y; Chen, CY; Tsai, TG; Chang, MN; Sheu, JT; 材料科學與工程學系; Department of Materials Science and Engineering |
| 28-二月-2005 | Variations of differential capacitance in SrBi2Ta2O9 ferroelectric films induced by photoperturbation | Leu, CC; Chien, CH; Chen, CY; Chang, MN; Hsu, FY; Hu, CT; Chen, YF; 電子物理學系; Department of Electrophysics |
