瀏覽 的方式： 作者 Chang, Pin-Hsin
顯示 1 到 5 筆資料，總共 5 筆
| 公開日期 | 標題 | 作者 |
| 1-十二月-2015 | Impact of Inner Pickup on ESD Robustness of Multifinger MOSFET in 28-nm High-k/Metal Gate CMOS Process | Lin, Chun-Yu; Chang, Pin-Hsin; Chang, Rong-Kun; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-四月-2015 | Improving ESD Robustness of pMOS Device With Embedded SCR in 28-nm High-k/Metal Gate CMOS Process | Lin, Chun-Yu; Chang, Pin-Hsin; Chang, Rong-Kun; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2015 | Study on the ESD-Induced Gate-Oxide Breakdown and the Protection Solution in 28nm High-K Metal-Gate CMOS Technology | Lin, Chun-Yu; Ker, Ming-Dou; Chang, Pin-Hsin; Wang, Wen-Tai; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2015 | Vertical SCR Structure for On-Chip ESD Protection in Nanoscale CMOS Technology | Lin, Chun-Yu; Chang, Pin-Hsin; Chang, Rong-Kun; Ker, Ming-Dou; Wang, Wen-Tai; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2014 | 高介電係數 /金屬閘極製程之靜電放電防護設計與研究 | 張品歆; Chang, Pin-Hsin; 柯明道; 林群祐; Ker, Ming-Dou; Lin, Chun-Yu; 電子工程學系 電子研究所 |
