| 公開日期 | 標題 | 作者 |
| 1-五月-2002 | Broadcasting cryptosystem in computer networks using geometric properties of lines | Hwang, MS; Lee, CC; Chang, TY; 資訊工程學系; Department of Computer Science |
| 15-四月-1999 | The construction of production performance prediction system for semiconductor manufacturing with artificial neural networks | Huang, CL; Huang, YH; Chang, TY; Chang, SH; Chung, CH; Huang, DT; Li, RK; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-六月-2004 | Cryptanalysis of publicly verifiable authenticated encryption | Chang, TY; Yang, CC; Hwang, MS; 資訊工程學系; Department of Computer Science |
| 1-八月-2004 | Cryptanalysis of simple authenticated key agreement protocols | Yang, CC; Chang, TY; Hwang, MS; 資訊工程學系; Department of Computer Science |
| 15-十二月-2005 | Cryptanalysis of the improved authenticated key agreement protocol | Chang, TY; Yang, CC; Yang, YW; 資訊工程學系; Department of Computer Science |
| 1-九月-2005 | Drain/gate-voltage-dependent on-current and off-current instabilities in polycrystalline silicon thin-film transistors under electrical stress | Wang, SD; Chang, TY; Lo, WH; Sang, JY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-十二月-2002 | Effect of CF4 plasma pretreatment on low temperature oxides | Chang, TY; Chen, HW; Lei, TF; Chao, TS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-2003 | Growing high-performance tunneling oxide by CF4 plasma pretreatment | Chang, TY; Lee, JW; Lei, TF; Lee, CL; Wen, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-八月-2002 | Impact of nitrogen and/or fluorine implantation on deep-submicron Co-salicide process | Chang, TY; Lei, TF; Chao, TS; Chen, SW; Kao, LM; Chen, SK; Tuan, A; Su, TP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-七月-2002 | Improvement of low-temperature gate dielectric formed in N2O plasma by an additional CF4 pretreatment process | Chang, TY; Lei, TF; Chao, TS; Wen, HC; Chen, HW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 25-三月-2005 | An improvement of the Yang-Shieh password authentication schemes | Yang, CC; Wang, RC; Chang, TY; 資訊工程學系; Department of Computer Science |
| 1-四月-1999 | Improvement of ultra-thin 3.3 nm thick oxide for co-salicide process using NF3 annealed poly-gate | Chang, TY; Lei, TF; Chao, TS; Huang, CT; Chen, SK; Tuan, A; Chou, S; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2004 | Improvement on pretty-simple password authenticated key-exchange protocol for wireless networks | Chang, TY; Yang, CC; Chen, CM; 資訊工程學系; Department of Computer Science |
| 5-四月-2005 | An improvement on the Lin-Wu (t, n) threshold verifiable multi-secret sharing scheme | Chang, TY; Hwang, MS; Yang, WP; 資訊工程學系; Department of Computer Science |
| 1-九月-2001 | An investigation of scanning capacitance microscopy on iron-contaminated p-type silicon | Chang, MN; Chang, TY; Pan, FM; Wu, BW; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2005 | Mechanism of on-current and off-current instabilities under electrical stress in polycrystalline silicon thin-film transistors | De Wang, S; Chang, TY; Lo, WH; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-六月-2005 | Mobile IP assistance in ad hoc routing security using geometric properties of lines | Chang, TY; Yang, CC; Chen, CM; 資訊工程學系; Department of Computer Science |
| 2005 | A new observation of the germanium outdiffusion effect on the hot carrier and NBTI reliabilities in sub-100nm technology strained-Si/SiGe CMOS devices | Chung, SS; Liu, YR; Yeh, CF; Wu, SR; Lai, CS; Chang, TY; Ho, JH; Liu, CY; Huang, CT; Tsai, CT; Shiau, WT; Sun, SW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-六月-2005 | A novel process-compatible fluorination technique with electrical characteristic improvements of poly-Si TFTs | Wang, SD; Lo, WH; Chang, TY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-八月-2002 | Observation of differential capacitance images on slightly iron-contaminated p-type silicon | Chang, MN; Chen, CY; Pan, FM; Chang, TY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
