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National Chiao Tung University Institutional Repository
Browsing by Author Chao, Li-Chang
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Showing results 1 to 3 of 3
Issue Date
Title
Author(s)
4-May-2008
Novel yield model for integrated circuits with clustered defects
Tong, Lee-Ing
;
Chao, Li-Chang
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
1-Aug-2009
Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index
Chao, Li-Chang
;
Tong, Lee-Ing
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
2008
整合良率預估及缺陷樣式辨識之晶圓缺陷診斷系統
趙豊昌
;
Chao, Li-Chang
;
唐麗英
;
Tong, Lee-Ing
;
工業工程與管理學系
