瀏覽 的方式： 作者 Chen, Ding-Yuan
顯示 1 到 2 筆資料，總共 2 筆
| 公開日期 | 標題 | 作者 |
| 2008 | Testing Methodology of Embedded DRAMs | Chang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Chen, Ding-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-九月-2018 | A versatile low-resistance ohmic contact process with ohmic recess and low-temperature annealing for GaN HEMTs | Lin, Yen-Ku; Bergsten, Johan; Leong, Hector; Malmros, Anna; Chen, Jr-Tai; Chen, Ding-Yuan; Kordina, Olof; Zirath, Herbert; Chang, Edward Yi; Rorsman, Niklas; 材料科學與工程學系; 電子工程學系及電子研究所; 國際半導體學院; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics; International College of Semiconductor Technology |
