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Browsing by Author Chen, W. B.
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Showing results 1 to 18 of 18
Issue Date
Title
Author(s)
2012
Advanced Metal-Gate/High-kappa CMOS with Small EOT and Better High Field Mobility
Chin, Albert
;
Chen, W. B.
;
Chen, P. C.
;
Wu, Y. H.
;
Chi, C. C.
;
Lee, Y. J.
;
Chang-Liao, K. S.
;
Kuan, C. H.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2010
Characteristics of Cerium Oxide for Metal-Insulator-Metal Capacitors
Cheng, C. H.
;
Hsu, H. H.
;
Chen, W. B.
;
Chin, Albert
;
Yeh, F. S.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Jun-2008
Comparison of MONOS memory device integrity when using Hf(1-x-y)N(x)O(y) trapping layers with different N compositions
Yang, H. J.
;
Cheng, C. F.
;
Chen, W. B.
;
Lin, S. H.
;
Yeh, F. S.
;
McAlister, Sean P.
;
Chin, Albert
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Jul-2009
Flat band voltage control on low V(t) metal-gate/high-kappa CMOSFETs with small EOT
Chin, Albert
;
Chang, M. F.
;
Lin, S. H.
;
Chen, W. B.
;
Lee, P. T.
;
Yeh, F. S.
;
Liao, C. C.
;
Li, M. -F.
;
Su, N. C.
;
Wang, S. J.
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
1-Jul-2009
Flat band voltage control on low V-t metal-gate/high-kappa CMOSFETs with small EOT
Chin, Albert
;
Chang, M. F.
;
Lin, S. H.
;
Chen, W. B.
;
Lee, P. T.
;
Yeh, F. S.
;
Liao, C. C.
;
Li, M. -F.
;
Su, N. C.
;
Wang, S. J.
;
電子工程學系及電子研究所
;
光電工程學系
;
光電工程研究所
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
;
Institute of EO Enginerring
1-Nov-2010
Gate-First TaN/La(2)O(3)/SiO(2)/Ge n-MOSFETs Using Laser Annealing
Chen, W. B.
;
Wu, C. H.
;
Shie, B. S.
;
Chin, Albert
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Nov-2010
Gate-First TaN/La2O3/SiO2/Ge n-MOSFETs Using Laser Annealing
Chen, W. B.
;
Wu, C. H.
;
Shie, B. S.
;
Chin, Albert
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Jan-2010
High Performance of Ge nMOSFETs Using SiO(2) Interfacial Layer and TiLaO Gate Dielectric
Chen, W. B.
;
Chin, Albert
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Jan-2010
High Performance of Ge nMOSFETs Using SiO2 Interfacial Layer and TiLaO Gate Dielectric
Chen, W. B.
;
Chin, Albert
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Jan-2011
High-field mobility metal-gate/high-kappa Ge n-MOSFETs with small equivalent-oxide-thickness
Chen, W. B.
;
Cheng, C. H.
;
Lin, C. W.
;
Chen, P. C.
;
Chin, Albert
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Dec-2010
High-Performance Gate-First Epitaxial Ge n-MOSFETs on Si With LaAlO(3) Gate Dielectrics
Chen, W. B.
;
Cheng, C. H.
;
Chin, Albert
;
光電學院
;
電子工程學系及電子研究所
;
College of Photonics
;
Department of Electronics Engineering and Institute of Electronics
1-Dec-2010
High-Performance Gate-First Epitaxial Ge n-MOSFETs on Si With LaAlO3 Gate Dielectrics
Chen, W. B.
;
Cheng, C. H.
;
Chin, Albert
;
光電學院
;
電子工程學系及電子研究所
;
College of Photonics
;
Department of Electronics Engineering and Institute of Electronics
1-Apr-2011
Higher Gate Capacitance Ge n-MOSFETs Using Laser Annealing
Chen, W. B.
;
Shie, B. S.
;
Chin, Albert
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2010
Higher kappa Metal-Gate/High-kappa/Ge n-MOSFETs with < 1 nm EOT Using Laser Annealing
Chen, W. B.
;
Shie, B. S.
;
Chin, Albert
;
Hsu, K. C.
;
Chi, C. C.
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Jul-2008
Improving the retention and endurance characteristics of charge-trapping memory by using double quantum barriers
Lin, S. H.
;
Yang, H. J.
;
Chen, W. B.
;
Yeh, F. S.
;
McAlister, Sean P.
;
Chin, Albert
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
23-Nov-2009
Interfacial layer dependence on device property of high-kappa TiLaO Ge/Si N-type metal-oxide-semiconductor capacitors at small equivalent-oxide thickness
Chen, W. B.
;
Chin, Albert
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Jun-2009
Low-Threshold-Voltage TaN/Ir/LaTiO p-MOSFETs Incorporating Low-Temperature-Formed Shallow Junctions
Lin, S. H.
;
Cheng, C. H.
;
Chen, W. B.
;
Yeh, F. S.
;
Chin, Albert
;
機械工程學系
;
電子工程學系及電子研究所
;
Department of Mechanical Engineering
;
Department of Electronics Engineering and Institute of Electronics
1-Sep-2009
Low-Threshold-Voltage TaN/LaTiO n-MOSFETs With Small EOT
Lin, S. H.
;
Cheng, C. H.
;
Chen, W. B.
;
Yeh, F. S.
;
Chin, Albert
;
機械工程學系
;
電子工程學系及電子研究所
;
Department of Mechanical Engineering
;
Department of Electronics Engineering and Institute of Electronics