| Issue Date | Title | Author(s) |
| 1-Dec-2010 | An alternative bend-testing technique for a flexible indium tin oxide film | Chen, Yen-Liang; Hsieh, Hung-Chih; Wu, Wang-Tsung; Wen, Bor-Jiunn; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 20-Dec-2010 | Alternative method for measuring the full-field refractive index of a gradient-index lens with normal incidence heterodyne interferometry | Chen, Yen-Liang; Hsieh, Hung-Chih; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 1-Mar-2009 | Full-field measurement of the phase retardation for birefringent elements by using common path heterodyne interferometry | Chen, Yen-Liang; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 1-Oct-2010 | Full-field refractive index distribution measurement of a gradient-index lens with heterodyne interferometry | Hsieh, Hung-Chih; Chen, Yen-Liang; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 1-Oct-2010 | Full-field refractive index distribution measurement of a gradient-index lens with heterodyne interferometry | Hsieh, Hung-Chih; Chen, Yen-Liang; Wu, Wang-Tsung; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; 光電工程研究所; Department of Photonics; Institute of EO Enginerring |
| 20-Jul-2011 | High-accuracy thickness measurement of a transparent plate with the heterodyne central fringe identification technique | Wu, Wang-Tsung; Hsieh, Hung-Chih; Chang, Wei-Yao; Chen, Yen-Liang; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 1-Sep-2010 | Improved technique for measuring full-field absolute phases in a common-path heterodyne interferometer | Chen, Yen-Liang; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 1-Jan-2018 | Investigation of Polarization Hysteresis and Transient Current Switching in Ferroelectric Aluminum-Doped Hafnium Oxides | Liu, Chien; Fan, Chia-Chi; Tseng, Chih-Yang; Hsu, Hsiao-Hsuan; Cheng, Chun-Hu; Chen, Yen-Liang; Chang, Chun-Yen; Chou, Wu-Ching; Lin, Chien-Liang; Fan, Yu-Chi; Lee, Tsung-Ming; 光電系統研究所; 電子物理學系; 電子工程學系及電子研究所; Institute of Photonic System; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics |
| 10-Dec-2008 | Method for determining full-field absolute phases in the common-path heterodyne interferometer with an electro-optic modulator | Chen, Yen-Liang; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 1-Jun-2010 | Method for gauge block measurement with the heterodyne central fringe identification technique | Wu, Wang-Tsung; Chen, Yen-Liang; Hsieh, Hung-Chih; Chang, Wei-Yao; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 1-Jan-2010 | A method for measuring the geometrical topography of a Rockwell diamond indenter | Chen, Yen-Liang; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 1-Oct-2013 | Monitoring Debris Flows Using Spatial Filtering and Entropy Determination Approaches | Kao, Hung-Ming; Ren, Hsuan; Lee, Chao-Shing; Chen, Yen-Liang; Lin, Yen-Shuo; Su, Yeng; 資訊工程學系; Department of Computer Science |
| 1-Dec-2008 | Nano-roughness measurements with a modified Linnik microscope and the uses of full-field heterodyne interferometry | Chen, Yen-Liang; Jian, Zhi-Cheng; Hsieh, Hung-Chih; Wu, Wang-Tsung; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 1-Nov-2007 | Optimal condition for full-field heterodyne interferometry | Jian, Zhi-Cheng; Chen, Yen-Liang; Hsieh, Hung-Chih; Hsieh, Po-Jen; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 1-Apr-2011 | Optimal sampling conditions for a commonly used charge-coupled device camera in the full-field heterodyne interferometry | Hsieh, Hung-Chih; Wu, Wang-Tsung; Chang, Wei-Yao; Chen, Yen-Liang; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 1-Feb-2009 | Two-wavelength full-field heterodyne interferometric profilometry | Hsieh, Hung-Chih; Chen, Yen-Liang; Jian, Zhi-Chen; Wu, Wang-Tsung; Su, Der-Chin; 光電工程學系; Department of Photonics |
| 2010 | 全場顯微干涉術及其在折射率及表面形貌之量測應用 | 陳彥良; Chen, Yen-Liang; 蘇德欽; Su, Der-Chin; 光電工程學系 |
| 2016 | 濕式洗滌塔酸氣處理效能提升 - 以某半導體廠為例 | 陳彥良; 白曛綾; Chen, Yen-Liang; Bai, Hsun-Ling; 工學院產業安全與防災學程 |
