瀏覽 的方式： 作者 Cheng, Chih-Chang
顯示 1 到 3 筆資料，總共 3 筆
| 公開日期 | 標題 | 作者 |
| 2007 | Impact of self-heating effect on hot carrier degradation in high-voltage LDMOS | Cheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-九月-2006 | Physics and characterization of various hot-carrier degradation modes in LDMOS by using a three-region charge-pumping technique | Cheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2008 | 高電壓橫向擴散金氧半電晶體中暫態熱載子效應與元件模型之探討 | 鄭志昌; Cheng, Chih-Chang; 汪大暉; Wang, Tahui; 電子研究所 |
