| 公開日期 | 標題 | 作者 |
| 1-二月-1996 | Antenna charging effects on the electrical characteristics of polysilicon gate during electron cyclotron resonance etching | Kang, TK; Ueng, SY; Dai, BT; Chen, LP; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-十二月-1996 | Au/Ge/Pd ohmic contacts to n-GaAs with the Mo/Ti diffusion barrier | Chai, CY; Huang, JA; Lai, YL; Wu, JW; Chang, CY; Chan, YJ; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2004 | Characteristics of (Pb, Sr)TiO3 films post treated by low temperature technologies | Wang, JL; Jan, CK; Shye, DC; Kuo, MW; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2002 | Characteristics of low-temperature-prepared (Ba, Sr)TiO3 films post treated by novel excimer laser annealing | Shye, DC; Chiou, BS; Hwang, CC; Chen, JS; Su, IW; Chou, CC; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-1996 | Characterization and fabrication of chimney-shaped metal field emitters | Cheng, HC; Wang, CC; Ku, TK; Hsieh, IJ; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-二月-1996 | Characterization of anodic aluminum oxide film and its application to amorphous silicon thin film transistors | Liang, CW; Luo, TC; Feng, MS; Cheng, HC; Su, D; 材料科學與工程學系; 電子工程學系及電子研究所; 奈米中心; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics; Nano Facility Center |
| 18-十二月-1997 | Characterization of GaN epitaxial layers on SiC substrates with AlxGa1-xN buffer layers | Lin, CF; Cheng, HC; Feng, MS; Chi, GC; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics |
| 1-十一月-2003 | Characterizing trench-gate power metal-oxide-semiconductor field effect transistor with multi-layer dielectrics at the trench bottom | Lin, MJ; Liaw, CW; Chang, FL; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-十二月-1997 | Charging damages to gate oxides in a helicon O-2 plasma | Lin, W; Kang, TK; Perng, YC; Dai, BT; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-十二月-1997 | Charging damages to gate oxides in a helicon O-2 plasma | Lin, W; Kang, TK; Perng, YC; Dai, BT; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-1998 | Chimney-shaped and plateau-shaped gate electrode field emission arrays | Tarntair, FG; Wang, CC; Hong, WK; Huang, HK; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1998 | Chimney-shaped and plateau-shaped gate electrode field emission arrays | Tarntair, FG; Wang, CC; Hong, WK; Huang, HK; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1998 | Chimney-shaped and plateau-shaped gate electrode field emission arrays | Tarntair, FG; Wang, CC; Hong, WK; Huang, HK; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-十一月-2001 | A comparative study of Ar and H-2 as carrier gases for the growth of SiC films on Si(100) by electron cyclotron resonance chemical vapor deposition at low temperature | Lee, WH; Lin, JC; Lee, C; Cheng, HC; Yew, TR; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 15-二月-2003 | Comparison of p-side down and p-side up GaN light-emitting diodes fabricated by laser lift-off | Chu, CF; Yu, CC; Cheng, HC; Lin, CF; Wang, SC; 光電工程學系; Department of Photonics |
| 1-十月-2002 | Controlling steps during early stages of the aligned growth of carbon nanotubes using microwave plasma enhanced chemical vapor deposition | Chen, LC; Wen, CY; Liang, CH; Hong, WK; Chen, KJ; Cheng, HC; Shen, CS; Wu, CT; Chen, KH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2002 | Current-temperature characteristics of low-temperature-sputtered (Ba,Sr)TiO3 films post treated by rapid thermal annealing | Shye, DC; Chen, JS; Kuo, MW; Chou, BCS; Jan, CK; Wu, MF; Chiou, BS; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-八月-2002 | Degradation of passivated and non-passivated N-channel low-temperature polycrystalline silicon TFTs prepared by excimer laser processing | Teng, TH; Huang, CY; Chang, TK; Lin, CW; Cheng, LJ; Lu, YL; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-四月-2003 | Dependence of polarization on temperature coefficient resistance of (Ba, Sr)TiO3 thin films post-treated by RTA | Shye, DC; Chiou, BS; Kuo, MW; Chen, JS; Chou, BCS; Jan, CK; Wu, MF; Cheng, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 13-一月-1997 | Deposition of polycrystalline beta-SiC films on Si substrates at room temperature | Cheng, KL; Cheng, HC; Lee, WH; Lee, CP; Liu, CC; Yew, TR; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
