Browsing by Author Cheng, L. W.
Showing results 1 to 3 of 3
| Issue Date | Title | Author(s) |
| 2008 | The Observation of Trapping and Detrapping Effects in High-k Gate Dielectric MOSFETs by a New Gate Current Random Telegraph Noise (I(G)-RTN) Approach | Chang, C. M.; Chung, Steve S.; Hsieh, Y. S.; Cheng, L. W.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2007 | Reliability of ALD Hf-based high K gate stacks with optimized interfacial layer and pocket implant engineering | Mao, A. Y.; Lin, W. M.; Yang, Cw.; Hsieh, Y. S.; Cheng, L. W.; Lee, G. D.; Tsai, C. T.; Chung, S. S.; Ma, G. H.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2006 | Twin-GD: A new twin gated-diode measurement for the interface characterization of ultra-thin gate oxide MOSFET's with EOT down to 1nm | Lee, G. D.; Chung, S. S.; Mao, A. Y.; Lin, W. M.; Yang, C. W.; Hsieh, Y. S.; Chu, K. T.; Cheng, L. W.; Tai, H.; Hsu, L. T.; Lee, C. R.; Meng, H. L.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
