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National Chiao Tung University Institutional Repository
Browsing by Author Chiang, Mu-Chi
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Showing results 1 to 1 of 1
Issue Date
Title
Author(s)
1-Mar-2007
Systematical study of reliability issues in plasma-nitrided and thermally nitrided oxides for advanced dual-gate oxide p-channel metal-oxide-semiconductor field-effect transistors
Lo, Wen-Cheng
;
Wu, Shien-Yang
;
Chang, Sun-Jay
;
Chiang, Mu-Chi
;
Lin, Chih-Yung
;
Chao, Tien-Sheng
;
Chang, Chun-Yen
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
