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Browsing by Author Chiang, WJ

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Issue DateTitleAuthor(s)
1-Feb-2004Effects of process and gate doping species on negative-bias-temperature instability of p-channel MOSFETsLee, DY; Huang, TY; Lin, HC; Chiang, WJ; Huang, GW; Wanga, T; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2002Process and doping species dependence of negative-bias-temperature instability for p-channel MOSFETsLee, DY; Lin, HC; Chiang, WJ; Lu, WT; Huang, GW; Huang, TY; Wang, T; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 2 of 2