瀏覽 的方式： 作者 Chung, Wei-Min
顯示 1 到 2 筆資料，總共 2 筆
| 公開日期 | 標題 | 作者 |
| 26-五月-2020 | SiCxNy-based resistive and threshold switching by using single precursor plasma-enhanced atomic layer deposition | Hsu, Yu-Lin; Chang, Yao-Feng; Chung, Wei-Min; Chen, Ying-Chen; Lin, Chao-Cheng; Leu, Jihperng; 材料科學與工程學系; Department of Materials Science and Engineering |
| 1-九月-2020 | A Study of the Relationship Between Endurance and Retention Reliability for a HfOx-Based Resistive Switching Memory | Chung, Wei-Min; Chang, Yao-Feng; Hsu, Yu-Lin; Chen, Y. -C. Daphne; Lin, Chao-Cheng; Lin, Chang-Hsieh; Leu, Jihperng; 材料科學與工程學系; Department of Materials Science and Engineering |
