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Browsing by Author Deng, Chih-Kang

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Showing results 1 to 16 of 16
Issue DateTitleAuthor(s)
2008CF4-plasma-induced fluorine passivation effects on poly-Si TFTs with high-kappa Pr2O3 gate dielectricChang, Chia-Wen; Huang, Po-Wei; Deng, Chih-Kang; Huang, Jiun-Jia; Chang, Hong-Ren; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Characteristics of Pr2O3 gate dielectric thin-film transistors fabricated on fluorine-ion-implanted polysilicon filmsChang, Chia-Wen; Deng, Chih-Kang; Huang, Jiun-Jia; Chang, Hong-Ren; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jun-2008Characterizing fluorine-ion implant effects on poly-Si thin-film transistors with Pr2O3 gate dielectricChang, Chia-Wen; Deng, Chih-Kang; Wu, Shih-Chieh; Huang, Jiun-Jia; Chang, Hong-Ren; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-2010Effects of CF(4) Plasma Treatment on the Electrical Characteristics of Poly-Silicon TFTs Using a Tb(2)O(3) Gate DielectricPan, Tung-Ming; Li, Zhi-Hong; Deng, Chih-Kang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-2010Effects of CF4 Plasma Treatment on the Electrical Characteristics of Poly-Silicon TFTs Using a Tb2O3 Gate DielectricPan, Tung-Ming; Li, Zhi-Hong; Deng, Chih-Kang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-2008Electrical enhancement of polycrystalline silicon thin-film transistors using fluorinated silicate glass passivation layerChang, Chia-Wen; Deng, Chih-Kang; Huang, Jiun-Jia; Wang, Tong-Yi; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-2008Electrical properties of high-kappa praseodymium oxide polycrystalline silicon thin-film transistors with nitrogen implantationDeng, Chih-Kang; Chang, Hong-Ren; Chiou, Bi-Shiou; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2008Enhanced performance and reliability for solid-phase crystallized poly-Si TFTs with argon ion implantation (vol 154, pg J375, 2007)Chang, Chia-Wen; Deng, Chih-Kang; Chang, Che-Lun; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Dec-2006ESD robustness of thin-film devices with different layout structures in LTPS technologyDeng, Chih-Kang; Ker, Ming-Dou; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-May-2008High-performance nanowire TFTs with metal-induced lateral crystallized poly-Si channelsChang, Chia-Wen; Chen, Szu-Fen; Chang, Che-Lun; Deng, Chih-Kang; Huang, Jiun-Jia; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2008High-performance solid-phase crystallized polycrystalline silicon thin-film transistors with floating-channel structureChang, Chia-Wen; Deng, Chih-Kang; Chang, Che-Lun; Liao, Ta-Chuan; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007On-panel electrostatic discharge (ESD) protection design with thin-film transistor in LTPS processKer, Ming-Dou; Chuang, Jie-Yao; Deng, Chih-Kang; Kuo, Chung-Hong; Li, Chun-Huai; Lai, Ming-Sheng; Wang, Chih-Wei; Liu, Chun-Ting; 電機學院; College of Electrical and Computer Engineering
1-Jun-2006On-Panel Output Buffer With Offset Compensation Technique for Data Driver in LTPS TechnologyKer, Ming-Dou; Deng, Chih-Kang; Huang, Ju-Lin; 電機學院; College of Electrical and Computer Engineering
1-Nov-2007A simple Spacer technique to fabricate poly-Si TFTs with 50-nm nanowire channelsChang, Chia-Wen; Deng, Chih-Kang; Chang, Hong-Ren; Chang, Che-Lun; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2010Stability of La(2)O(3) Metal-Insulator-Metal Capacitors under Constant Voltage StressWu, Shu-Hua; Deng, Chih-Kang; Hou, Tuo-Hung; Chiou, Bi-Shiou; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2010Stability of La2O3 Metal-Insulator-Metal Capacitors under Constant Voltage StressWu, Shu-Hua; Deng, Chih-Kang; Hou, Tuo-Hung; Chiou, Bi-Shiou; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 16 of 16