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Issue DateTitleAuthor(s)
1-Mar-2017Electrical instability of InGaZnO thin-film transistors with and without titanium sub-oxide layer under light illuminationChiu, Y. C.; Zheng, Z. W.; Cheng, C. H.; Chen, P. C.; Yen, S. S.; Fan, C. C.; Hsu, H. H.; Kao, H. L.; Chang, C. Y.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jun-2018The Impact of the Shallow-Trench Isolation Effect on Flicker Noise of Source Follower MOSFETs in a CMOS Image SensorFan, C. C.; Chiu, Y. C.; Liu, C.; Lai, W. W.; Cheng, C. H.; Lin, D. L.; Li, G. R.; Lo, Y. H.; Chang, C. W.; Tsai, C. C.; Chang, C. Y.; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
27-Oct-2018On the Electrical Characteristics of Ferroelectric FinFET Using Hafnium Zirconium Oxide with Optimized Gate StackLin, M. H.; Fan, C. C.; Hsu, H. H.; Liu, C.; Chen, K. M.; Cheng, C. H.; Chang, C. Y.; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
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