瀏覽 的方式： 作者 Fu, KY
顯示 1 到 3 筆資料，總共 3 筆
| 公開日期 | 標題 | 作者 |
| 1-八月-2000 | Forward gated-diode measurement of filled traps in high-field stressed thin oxides | Chen, MJ; Kang, TK; Huang, HT; Liu, CH; Chang, YJ; Fu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-2001 | Low-frequency noise in n-channel metal-oxide-semiconductor field-effect transistors undergoing soft breakdown | Chen, MJ; Kang, TK; Lee, YH; Liu, CH; Chang, YJ; Fu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 24-七月-2000 | Oxide thinning percolation statistical model for soft breakdown in ultrathin gate oxides | Chen, MJ; Kang, TK; Liu, CH; Chang, YJ; Fu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
