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Browsing by Author Gu, Shaw-Hung

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Issue DateTitleAuthor(s)
16-Oct-2006Extraction of nitride trap density from stress induced leakage current in silicon-oxide-nitride-oxide-silicon flash memoryGu, Shaw-Hung; Wang, Tahui; Lu, Wen-Pin; Ku, Yen-Hui Joseph; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2007Numerical simulation of bottom oxide thickness effect on charge retention in SONOS flash memory cellsGu, Shaw-Hung; Hsu, Chih-Wei; Wang, Tahui; Lu, Wen-Pin; Ku, Yen-Hui Joseph; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 2 of 2