瀏覽 的方式： 作者 HO, JH
顯示 1 到 6 筆資料，總共 6 筆
| 公開日期 | 標題 | 作者 |
| 1-二月-1990 | ELLIPSOMETRY MEASUREMENT OF THE COMPLEX REFRACTIVE-INDEX AND THICKNESS OF POLYSILICON THIN-FILMS | HO, JH; LEE, CL; LEI, TF; CHAO, TS; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering |
| 1-八月-1990 | ELLIPSOMETRY MEASUREMENTS ON REFRACTIVE-INDEX PROFILES OF THIN-FILMS | HO, JH; LEE, CL; LEI, TF; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering |
| 1-九月-1987 | ELLIPSOMETRY MEASUREMENTS ON SIO2-FILMS FOR THICKNESSES UNDER 200-A | HO, JH; LEE, CL; JEN, CW; LEI, TF; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering |
| 1-八月-1988 | ERROR REDUCTION IN THE ELLIPSOMETRIC MEASUREMENT ON THIN-FILMS | HO, JH; LEE, CL; LEI, TF; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering |
| 1-八月-1991 | A REAL-TIME C-V MEASUREMENT CIRCUIT FOR MOS CAPACITORS UNDER CURRENT STRESSING | LEE, CL; LEI, TF; HO, JH; WANG, WT; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 3-八月-1989 | REFRACTIVE-INDEX PROFILE MEASUREMENT OF COMPOUND THIN-FILMS BY ELLIPSOMETRY | HO, JH; LEE, CL; LEI, TF; 交大名義發表; 電控工程研究所; National Chiao Tung University; Institute of Electrical and Control Engineering |
