瀏覽 的方式： 作者 HO, TS
顯示 1 到 2 筆資料，總共 2 筆
| 公開日期 | 標題 | 作者 |
| 1-九月-1993 | CHARGE LOSS DUE TO AC PROGRAM DISTURBANCE STRESSES IN EPROMS | LIN, JK; CHANG, CY; WANG, TH; HUANG, HS; CHEN, KL; HO, TS; KO, J; 電控工程研究所; Institute of Electrical and Control Engineering |
| 1-六月-1993 | TRANSIENT AND STEADY-STATE CARRIER TRANSPORT UNDER HIGH-FIELD STRESSES IN SONOS EEPROM DEVICE | LIN, JK; CHANG, CY; HUANG, HS; HO, TS; CHEN, KL; 電控工程研究所; Institute of Electrical and Control Engineering |
