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Issue DateTitleAuthor(s)
1-Apr-2006Investigation of DC hot-carrier degradation at elevated temperatures for n-channel metal-oxide-semiconductor field-effect-transistor of 0.13 mu m technologyLin, JC; Chen, SY; Chen, HW; Jhou, ZW; Lin, HC; Chou, S; Ko, J; Lei, TF; Haung, HS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2006Mismatches after hot-carrier injection in advanced complementary metal-oxide-semiconductor technology particularly for analog applicationsChen, SY; Lin, JC; Chen, HW; Lin, HC; Jhou, ZW; Chou, S; Ko, J; Lei, TF; Haung, HS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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