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Showing results 1 to 6 of 6
Issue DateTitleAuthor(s)
1-Jun-2015Impact of V-pass Interference on Charge-Trapping NAND Flash Memory DevicesHsiao, Yi-Hsuan; Lue, Hang-Ting; Chen, Wei-Chen; Chang, Kuo-Pin; Tsui, Bing-Yue; Hsieh, Kuang-Yeu; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jun-2014Modeling the Impact of Random Grain Boundary Traps on the Electrical Behavior of Vertical Gate 3-D NAND Flash Memory DevicesHsiao, Yi-Hsuan; Lue, Hang-Ting; Chen, Wei-Chen; Chang, Kuo-Pin; Shih, Yen-Hao; Tsui, Bing-Yue; Hsieh, Kuang-Yeu; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2012Modeling the Variability Caused by Random Grain Boundary and Trap-location Induced Asymmetrical Read Behavior for a Tight-pitch Vertical Gate 3D NAND Flash Memory Using Double-Gate Thin-Film Transistor (TFT) DeviceHsiao, Yi-Hsuan; Lue, Hang-Ting; Chen, Wei-Chen; Chen, Chih-Ping; Chang, Kuo-Ping; Shih, Yen-Hao; Tsui, Bing-Yue; Lu, Chih-Yuan; 交大名義發表; National Chiao Tung University
1-Dec-2006Process and characteristics of fully silicided source/drain (FSD) thin-film transistorsLin, Chia-Pin; Hsiao, Yi-Hsuan; Tsui, Bing-Yue; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Oct-2015Ultra-High Bit Density 3D NAND Flash-Featuring-Assisted Gate OperationHsiao, Yi-Hsuan; Lue, Hang-Ting; Chen, Wei-Chen; Tsui, Bing-Yue; Hsieh, Kuang-Yeu; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015三維快閃記憶體技術及其特殊現象之研究蕭逸璿; Hsiao, Yi-Hsuan; 崔秉鉞; 呂函庭; Tsui, Bing-Yue; Lue, Hang-Ting; 電子工程學系 電子研究所
Showing results 1 to 6 of 6