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Browsing by Author Huang, Shih-En

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Issue DateTitleAuthor(s)
1-Jun-2019Investigation of Fin-Width Sensitivity of Threshold Voltage for InGaAs and Si Negative-Capacitance FinFETs Considering Quantum-Confinement EffectHuang, Shih-En; Yu, Chien-Lin; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jan-2020Investigation of Inversion Charge Characteristics and Inversion Charge Loss for InGaAs Negative-Capacitance Double-Gate FinFETs Considering Quantum CapacitanceHuang, Shih-En; Lin, Shih-Han; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 2 of 2