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Browsing by Author Hung, Chi-Chao

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Issue DateTitleAuthor(s)
1-Sep-2007An innovative understanding of metal-insulator-metal (MIM)-capacitor degradation under constant-current stressHung, Chi-Chao; Oates, Anthony S.; Lin, Horng-Chih; Chang, Yu-En Percy; Wang, Jia-Lian; Huang, Cheng-Chung; Yau, You-Wen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007New understanding of metal-insulator-metal (MIM) capacitor degradation behaviorHung, Chi-Chao; Oates, Anthony S.; Lin, H. C.; Chang, Percy; Wang, J. L.; Huang, C. C.; Yau, Y. W.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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