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Browsing by Author Hung, HY

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Issue DateTitleAuthor(s)
1-Jan-2002Curing of polyimide and the effect of the TEOS SiO2 barrier layer on the electromigration of sputtered Cu with polyimide passivationHung, HY; Chiou, BS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2000Electromigration in sputtered copper interconnection with polyimide as interlevel dielectric or passivationChiou, BS; Jiang, JS; Wang, HW; Hung, HY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Wavelet transform based digital watermarking for image authenticationTsai, MJ; Hung, HY; 資訊管理與財務金融系 註：原資管所+財金所; Department of Information Management and Finance
Showing results 1 to 3 of 3