Browsing by Author Jong, Y. C.
Showing results 1 to 3 of 3
| Issue Date | Title | Author(s) |
| 2007 | Impact of self-heating effect on hot carrier degradation in high-voltage LDMOS | Cheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2006 | Investigation of hot carrier degradation modes in LDMOS by using a novel three-region charge pumping technique | Cheng, C. C.; Tu, K. C.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Sam C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-Sep-2006 | Physics and characterization of various hot-carrier degradation modes in LDMOS by using a three-region charge-pumping technique | Cheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
