Browsing by Author Ku, Y. H. Joseph
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
| 2006 | Insight of stress effect on the ONO stack layer in a SONOS-type flash memory cell | Yeh, C. C.; Liao, Y. Y.; Wang, Tahui; Tsai, W. J.; Lu, T. C.; Kao, H. L.; Ou, T. F.; Chen, M. S.; Chen, Y. K.; Lai, E. K.; Shih, Y. H.; Ting, WenChi; Ku, Y. H. Joseph; Lit, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
