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Browsing by Author Kuo, Shih-Hua

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Issue DateTitleAuthor(s)
2015Random Pattern Generation for Post-Silicon Validation of DDR3 SDRAMYang, Hao-Yu; Kuo, Shih-Hua; Huang, Tzu-Hsuan; Chen, Chi-Hung; Lin, Chris; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015Statistical Techniques for Predicting System-Level Failure using Stress-Test DataChen, Harry H.; Kuo, Shih-Hua; Tung, Jonathan; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2013Testing Retention Flip-flops in Power-gated DesignsHsu, Hao-Wen; Kuo, Shih-Hua; Chang, Wen-Hsiang; Chen, Shi-Hao; Chang, Ming-Tung; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2014降壓超頻測試： 藉由晶片的錯誤行為來預測系統層級錯誤郭士華; Kuo, Shih-Hua; 趙家佐; Chao, Chia-Tso; 電子工程學系 電子研究所
Showing results 1 to 4 of 4