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Showing results 1 to 8 of 8
Issue DateTitleAuthor(s)
1-Feb-1994ANALYSIS OF BILATERAL LATCH-UP TRIGGERING IN VLSI CIRCUITSHUANG, HS; CHANG, CY; HSU, CC; CHEN, KL; LIN, JK; 電控工程研究所; Institute of Electrical and Control Engineering
1-Nov-1993THE BEHAVIOR OF BILATERAL LATCH-UP TRIGGERING IN VLSI ELECTROSTATIC DISCHARGE DAMAGE PROTECTION CIRCUITSHUANG, HS; CHANG, CY; HSU, CC; CHEN, KL; LIN, JK; 電控工程研究所; Institute of Electrical and Control Engineering
1-Sep-1993CHARGE LOSS DUE TO AC PROGRAM DISTURBANCE STRESSES IN EPROMSLIN, JK; CHANG, CY; WANG, TH; HUANG, HS; CHEN, KL; HO, TS; KO, J; 電控工程研究所; Institute of Electrical and Control Engineering
1994A NEW LOCAL TRAINING RULE FOR HIGHER-ORDER ASSOCIATIVE MEMORIESCHANG, JY; LIU, WH; LIN, JK; 電控工程研究所; Institute of Electrical and Control Engineering
1-May-1994NEW POLYSILICON-OXIDE-NITRIDE-OXIDE-SILICON ELECTRICALLY ERASABLE PROGRAMMABLE READ-ONLY MEMORY DEVICE APPROACH FOR ELIMINATING OFF-CELL LEAKAGE CURRENTLIN, JK; CHANG, CY; HUANG, HS; CHEN, KL; KUO, DC; 電控工程研究所; Institute of Electrical and Control Engineering
1993THE PERCEPTRON TRAINING RULE FOR BIDIRECTIONAL ASSOCIATIVE MEMORYLIN, JK; CHANG, JY; 電控工程研究所; Institute of Electrical and Control Engineering
1-Jan-1994A STUDY ON BILATERAL LATCH-UP SELF-TRIGGERING IN COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR PROTECTION CIRCUITSHUANG, HS; CHANG, CY; CHEN, KL; LIU, IO; HSU, CC; LIN, JK; 電控工程研究所; Institute of Electrical and Control Engineering
1-Jun-1993TRANSIENT AND STEADY-STATE CARRIER TRANSPORT UNDER HIGH-FIELD STRESSES IN SONOS EEPROM DEVICELIN, JK; CHANG, CY; HUANG, HS; HO, TS; CHEN, KL; 電控工程研究所; Institute of Electrical and Control Engineering
Showing results 1 to 8 of 8