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Browsing by Author Lai, C. S.

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Issue DateTitleAuthor(s)
2008More Strain and Less Stress- The Guideline for Developing High-End Strained CMOS Technologies with Acceptable ReliabilityChung, Steve S.; Hsieh, E. R.; Huang, D. C.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006New observations on the uniaxial and biaxial strain-induced hot carrier and NBTI Reliabilities for 65nm node CMOS devices and beyondChung, Steve S.; Huang, D. C.; Tsai, Y. J.; Lai, C. S.; Tsai, C. H.; Liu, P. W.; Lin, Y. H.; Tsai, C. T.; Ma, G. H.; Chien, S. C.; Sun, S. W.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Novel ultra-low voltage and high-speed programming/erasing schemes for SONOS flash memory with excellent data retentionChung, Steve S.; Tseng, Y. H.; Lai, C. S.; Hsu, Y. Y.; Ho, Eric; Chen, Terry; Peng, L. C.; Chu, C. H.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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