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Browsing by Author Lee, Jam-Wem
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Showing results 1 to 9 of 9
Issue Date
Title
Author(s)
2007
Bias temperature instabilities for low-temperature polycrystalline silicon complementary thin-film transistors
Chen, Chih-Yang
;
Lee, Jam-Wem
;
Ma, Ming-Wen
;
Chen, Wei-Cheng
;
Lin, Hsiao-Yi
;
Yeh, Kuan-Lin
;
Wang, Shen-De
;
Lei, Tan-Fu
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2005
A compact model for electrostatic discharge protection nanoelectronics simulation
Chou, Hung-Mu
;
Yu, Shao-Ming
;
Lee, Jam-Wem
;
Li, Yiming
;
電信工程研究所
;
友訊交大聯合研發中心
;
Institute of Communications Engineering
;
D Link NCTU Joint Res Ctr
2007
Enhanced performance and reliability for solid phase crystallized poly-Si TFTs with argon ion implantation
Chang, Chia-Wen
;
Chang, Che-Lun
;
Luo, Wun-Chen
;
Lee, Jam-Wem
;
Lei, Tan-Fu
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2007
Improvement of electrical characteristics for novel process-compatible floating channel solid-phase crystallized poly-Si TFTs
Chang, Chia-Wen
;
Chang, Che-Lun
;
Lee, Jam-Wem
;
Lei, Tan-Fu
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2007
Performance and reliability improvement for poly-Si TFTs using fluorinated silicate glass inter-layer-dielectric passivation
Chang, Chia-Wen
;
Wu, Tin-Wei
;
Wang, Tong-Yi
;
Chang, Che-Lun
;
Lee, Jam-Wem
;
Lei, Tan-Fu
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Nov-2006
Plasma damage-enhanced negative bias temperature instability in low-temperature polycrystalline silicon thin-film transistors
Chen, Chih-Yang
;
Lee, Jam-Wem
;
Chen, Wei-g Chen
;
Lin, Hsiao-Yi
;
Yeh, Kuan-Lin
;
Lee, Po-Hao
;
Wang, Shen-De
;
Lei, Tan-Fu
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2007
Plasma-induced damage on the performance and reliability of low-temperature polycrystalline silicon thin-film transistors
Chen, Chih-Yang
;
Wang, Shen-De
;
Shieh, Ming-Shan
;
Chen, Wei-Cheng
;
Lin, Hsiao-Yi
;
Yeh, Kuan-Lin
;
Lee, Jam-Wem
;
Lei, Tan-Fu
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-May-2007
A reliability model for low-temperature polycrystalline silicon thin-film transistors
Chen, Chih-Yang
;
Lee, Jam-Wem
;
Lee, Po-Hao
;
Chen, Wei-Cheng
;
Lin, Hsiao-Yi
;
Yeh, Kuan-Lin
;
Ma, Ming-Wen
;
Wang, Shen-De
;
Lei, Tan-Fu
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
1-Oct-2004
Silicon-Germanium Structure in Surrounding-Gate Strained Silicon Nanowire Field Effect Transistors
Li, Yiming
;
Lee, Jam-Wem
;
Chou, Hung-Mu
;
電子物理學系
;
友訊交大聯合研發中心
;
Department of Electrophysics
;
D Link NCTU Joint Res Ctr