Browsing by Author Lee, Jih-Nung
Showing results 1 to 6 of 6
| Issue Date | Title | Author(s) |
| 1-一月-2019 | Layout-Based Dual-Cell-Aware Tests | Wu, Tse-Wei; Lee, Dong-Zhen; Wu, Kai-Chiang; Huang, Yu-Hao; Chen, Ying-Yen; Chen, Po-Lin; Chern, Mason; Lee, Jih-Nung; Kao, Shu-Yi; Chao, Mango C. -T.; 資訊工程學系; 電子工程學系及電子研究所; Department of Computer Science; Department of Electronics Engineering and Institute of Electronics |
| 1-Jan-2017 | Methodology of Generating Dual-Cell-Aware Tests | Huang, Yu-Hao; Lu, Ching-Ho; Wu, Tse-Wei; Nien, Yu-Teng; Chen, Ying-Yen; Wu, Max; Lee, Jih-Nung; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-Jan-2019 | Methodology of Generating Timing-Slack-Based Cell-Aware Tests | Nien, Yu-Teng; Wu, Kai-Chiang; Lee, Dong-Zhen; Chen, Ying-Yen; Chen, Po-Lin; Chern, Mason; Lee, Jih-Nung; Kao, Shu-Yi; Chao, Mango Chia-Tso; 資訊工程學系; 電子工程學系及電子研究所; Department of Computer Science; Department of Electronics Engineering and Institute of Electronics |
| 1-Oct-2018 | A Model-Based-Random-Forest Framework for Predicting V-t Mean and Variance Based on Parallel I-d Measurement | Lin, Chien-Hsueh; Tsai, Chih-Ying; Lee, Kao-Chi; Yu, Sung-Chu; Liau, Wen-Rong; Hou, Alex Chun-Liang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2016 | Predicting V-t Mean and Variance from Parallel I-d Measurement with Model-Fitting Technique | Tsai, Chih-Ying; Lee, Kao-Chi; Lin, Chien-Hsueh; Yu, Sung-Chu; Liau, Wen-Rong; Hou, Alex Chun-Liang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-2017 | Predicting Vt Variation and Static IR Drop of Ring Oscillators Using Model-Fitting Techniques | Huang, Tzu-Hsuan; Hung, Wei-Tse; Yang, Hao-Yu; Chang, Wen-Hsiang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
