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Showing results 1 to 4 of 4
Issue DateTitleAuthor(s)
1-Jan-2003Characteristics of vertical thermal/PECVD polysilicon oxides formed on the sidewall of polysilicon filmsLee, MZ; Chang, YA; Lee, CL; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Improvement of junction leakage by using a Zr cap layer on a 30 nm ultrashallow nickel-silicide junctionLee, TL; Lee, MZ; Lei, TF; Lee, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-2004Memory properties of metal/ferroelectric/semiconductor and metal/ferroelectric/insulator/semiconductor structures using rf sputtered ferroelectric Sr0.8Bi2.5Ta1.2Nb0.8O9 thin filmsHuang, CH; Wang, YK; Lue, HT; Huang, JY; Lee, MZ; Tseng, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2003Novel vertical polysilicon thin-film transistor with excimer-laser annealingLee, MZ; Lee, CL; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 4 of 4