| Issue Date | Title | Author(s) |
| 1-Mar-2007 | Calibration 90 nm node RF mosfets, including stress degradation | Kao, H. L.; Kao, C. H.; Chin, A.; Liao, C. C.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2006 | DC-RF performance improvement for strained 0.13 mu m MOSFETs mounted on a flexible plastic substrate | Kao, H. L.; Chin, Albert; Liao, C. C.; Tseng, Y. Y.; McAlister, S. P.; Chi, C. C.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-Jul-2009 | Flat band voltage control on low V(t) metal-gate/high-kappa CMOSFETs with small EOT | Chin, Albert; Chang, M. F.; Lin, S. H.; Chen, W. B.; Lee, P. T.; Yeh, F. S.; Liao, C. C.; Li, M. -F.; Su, N. C.; Wang, S. J.; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics |
| 1-七月-2009 | Flat band voltage control on low V-t metal-gate/high-kappa CMOSFETs with small EOT | Chin, Albert; Chang, M. F.; Lin, S. H.; Chen, W. B.; Lee, P. T.; Yeh, F. S.; Liao, C. C.; Li, M. -F.; Su, N. C.; Wang, S. J.; 電子工程學系及電子研究所; 光電工程學系; 光電工程研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of EO Enginerring |
| 2007 | Improvement of the performance of strained 0.13 mu m MOSFETs mounted on flexible plastic substrates | Kao, H. L.; Liao, C. C.; McAlister, S. P.; Chin, Albert; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-一月-2008 | Low V-t gate-first Al/TaN/[Ir3Si-HfSi2-x]/HfLaON CMOS using simple laser annealing/reflection | Liao, C. C.; Chin, Albert; Su, N. C.; Li, M. -F.; Wang, S. J.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2008 | Low V-t gate-first Al/TaN/[Ir3Si-HfSi2-x]/HfLaON CMOS using simple laser annealing/reflection | Liao, C. C.; Chin, Albert; Su, N. C.; Li, M. -F.; Wang, S. J.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-二月-2013 | Metal-Gate/High-kappa/Ge nMOS at Small CET With Higher Mobility Than SiO2/Si at Wide Range Carrier Densities | Liao, C. C.; Ku, T. C.; Lin, M. H.; Zeng, Lang; Kang, Jinfeng; Liu, Xiaoyan; Chin, Albert; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 6-Jul-2006 | Strain enhanced DC-RF performance of 0.13 mu m nMOSFETs on flexible plastic substrate | Chin, A.; Kao, H. L.; Kao, C. H.; Liao, C. C.; Tseng, Y. Y.; Chi, C. C.; 奈米科技中心; Center for Nanoscience and Technology |
| 1-Jan-2007 | Very low noise in 90nm node RF MOSFETs using a new layout | Kao, H. L.; Chin, Albert; Liao, C. C.; McAlister, S. P.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
