瀏覽 的方式： 作者 Liau, Wen-Rong
顯示 1 到 3 筆資料，總共 3 筆
| 公開日期 | 標題 | 作者 |
| 1-十月-2018 | A Model-Based-Random-Forest Framework for Predicting V-t Mean and Variance Based on Parallel I-d Measurement | Lin, Chien-Hsueh; Tsai, Chih-Ying; Lee, Kao-Chi; Yu, Sung-Chu; Liau, Wen-Rong; Hou, Alex Chun-Liang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-二月-2016 | Predicting Shot-Level SRAM Read/Write Margin Based on Measured Transistor Characteristics | Bin, Shu-Yung; Lin, Shih-Feng; Cheng, Ya-Ching; Liau, Wen-Rong; Hou, Alex; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2016 | Predicting V-t Mean and Variance from Parallel I-d Measurement with Model-Fitting Technique | Tsai, Chih-Ying; Lee, Kao-Chi; Lin, Chien-Hsueh; Yu, Sung-Chu; Liau, Wen-Rong; Hou, Alex Chun-Liang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
