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Issue DateTitleAuthor(s)
2005A new insight into the degradation mechanisms of various mobility-enhanced CMOS devices with different substrate engineeringChung, SS; Liu, YR; Wu, SJ; Lai, CS; Liu, YC; Chen, DF; Lin, HS; Shiau, WT; Tsai, CT; Chien, SC; Sun, SW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2002A novel and direct determination of the interface traps in sub-100nm CMOS devices with direct tunneling regime (12 similar to 16A) gate oxideChung, SS; Chen, SJ; Yang, CK; Cheng, SM; Lin, SH; Sheng, YC; Lin, HS; Hung, KT; Wu, DY; Yew, TR; Chien, SC; Liou, FT; Wen, F; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Virtual integration and profitability: some evidence from Taiwan's IC industryChu, PY; Teng, MJ; Huang, CH; Lin, HS; 管理科學系; Department of Management Science
Showing results 1 to 3 of 3