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Issue DateTitleAuthor(s)
1-Aug-2003Anomalous latchup failure induced by on-chip ESD protection circuit in a high-voltage CMOS IC productLin, IC; Huang, CY; Chao, CJ; Ker, MD; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-2004Design optimization of ESD protection and latchup prevention for a serial I/O ICHuang, CY; Chen, WF; Chuan, SY; Chiu, FC; Tseng, JC; Lin, IC; Chao, CJ; Leu, LY; Ker, MD; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-2005Mirror MoCap: Automatic and efficient capture of dense 3D facial motion parameters from videoLin, IC; Ouhyoung, M; 資訊工程學系; Department of Computer Science
Showing results 1 to 3 of 3