瀏覽 的方式： 作者 Lin, Min-Chen
顯示 1 到 5 筆資料，總共 5 筆
| 公開日期 | 標題 | 作者 |
| 1-四月-2010 | Benefit of NMOS by Compressive SiN as Stress Memorization Technique and Its Mechanism | Liao, Chia-Chun; Chiang, Tsung-Yu; Lin, Min-Chen; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics |
| 1-十一月-2011 | Effects of Channel Width and Nitride Passivation Layer on Electrical Characteristics of Polysilicon Thin-Film Transistors | Liao, Chia-Chun; Lin, Min-Chen; Chiang, Tsung-Yu; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics |
| 1-六月-2012 | Hydrogen Instability Induced by Postannealing on Poly-Si TFTs | Liao, Chia-Chun; Lin, Min-Chen; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics |
| 2011 | Impact of Strain Layer on Gate Leakage and Interface-State for nMOSFETs Fabricated by Stress-Memorization Technique | Liao, Chia-Chun; Lin, Min-Chen; Chiang, Tsung-Yu; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics |
| 1-二月-2012 | Impacts of the Underlying Insulating Layers on the MILC Growth Length and Electrical Characteristics | Liao, Chia-Chun; Lin, Min-Chen; Liu, Shao-Xuan; Chao, Tien-Sheng; 電子物理學系; Department of Electrophysics |
