瀏覽 的方式： 作者 Lin, Shi-Tin
顯示 1 到 2 筆資料，總共 2 筆
| 公開日期 | 標題 | 作者 |
| 1-一月-2007 | Study of low-temperature and post-stress hysteresis in high-k gate dielectrics | Wu, You-Lin; Lin, Shi-Tin; Yang, Chang Cheng; Wu, Chien-Hung; Chin, Albert; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2007 | Study of low-temperature and post-stress hysteresis in high-k gate dielectrics | Wu, You-Lin; Lin, Shi-Tin; Yang, Chang Cheng; Wu, Chien-Hung; Chin, Albert; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
