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Browsing by Author Lin, Yi-Tang

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Issue DateTitleAuthor(s)
1-May-2009Distinguishing Between STI Stress and Delta Width in Gate Direct Tunneling Current of Narrow n-MOSFETsHsieh, Chen-Yu; Lin, Yi-Tang; Chen, Ming-Jer; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Aug-2009Enhanced Hole Gate Direct Tunneling Current in Process-Induced Uniaxial Compressive Stress p-MOSFETsHsu, Chih-Yu; Lee, Chien-Chih; Lin, Yi-Tang; Hsieh, Chen-Yu; Chen, Ming-Jer; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015紅色供應鏈對台灣電子產業之衝擊林義唐; Lin, Yi-Tang; 葉銀華; Yeh, Yin-Hua; 管理學院財務金融學程
Showing results 1 to 3 of 3