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Showing results 1 to 11 of 11
Issue DateTitleAuthor(s)
12-Mar-2014Effect of ion-milled barriers on electron transport in micrometer-sized tunnel junctionsLee, Yen-Chi; Lin, Yong-Han; Wu, Jong-Ching; Lin, Juhn-Jong; 電子物理學系; 物理研究所; Department of Electrophysics; Institute of Physics
7-Jan-2009Electrical conduction mechanisms in natively doped ZnO nanowiresChiu, Shao-Pin; Lin, Yong-Han; Lin, Juhn John; 電子物理學系; 物理研究所; Department of Electrophysics; Institute of Physics
15-Sep-2011Fluctuation-induced tunneling conduction through RuO(2) nanowire contactsLin, Yong-Han; Lin, Juhn-Jong; 電子物理學系; 物理研究所; Department of Electrophysics; Institute of Physics
15-Sep-2011Fluctuation-induced tunneling conduction through RuO2 nanowire contactsLin, Yong-Han; Lin, Juhn-Jong; 電子物理學系; 物理研究所; Department of Electrophysics; Institute of Physics
11-Mar-2009Four-probe electrical-transport measurements on single indium tin oxide nanowires between 1.5 and 300 KChiu, Shao-Pin; Chung, Hui-Fang; Lin, Yong-Han; Kai, Ji-Jung; Chen, Fu-Rong; Lin, Juhn-Jong; 電子物理學系; 物理研究所; Department of Electrophysics; Institute of Physics
1-Jan-2007Growth of single-crystalline RuO2 nanowires with one- and two-nanocontact electrical characterizationsLiu, Yee-Lang; Wu, Zong-Yi; Lin, Kuei-Jiun; Huang, Jr-Jeng; Chen, Fu-Rong; Kai, Ji-Jung; Lin, Yong-Han; Jian, Wen-Bin; Lin, Juhn-Jong; 電子物理學系; 物理研究所; Department of Electrophysics; Institute of Physics
5-Sep-2012Metallic conduction and large electron-phonon-impurity interference effect in single TiSi nanowiresHsu, Wei-Che; Chen, Chao-Chun; Lin, Yong-Han; Lin, Huang-Kai; Chiu, Hsin-Tien; Lin, Juhn-Jong; 電子物理學系; 應用化學系; 物理研究所; Department of Electrophysics; Department of Applied Chemistry; Institute of Physics
1-Sep-2012Observation of fluctuation-induced tunneling conduction in micrometer-sized tunnel junctionsLai, Yu-Ren; Yu, Kai-Fu; Lin, Yong-Han; Wu, Jong-Ching; Lin, Juhn-Jong; 電子物理學系; 物理研究所; Department of Electrophysics; Institute of Physics
29-Jul-2016Structural order and melting of a quasi-one-dimensional electron systemRees, David G.; Beysengulov, Niyaz R.; Teranishi, Yoshiaki; Tsao, Chun-Shuo; Yeh, Sheng-Shiuan; Chiu, Shao-Pin; Lin, Yong-Han; Tayurskii, Dmitrii A.; Lin, Juhn-Jong; Kono, Kimitoshi; 電子物理學系; 物理研究所; Department of Electrophysics; Institute of Physics
10-Sep-2008Thermal fluctuation-induced tunneling conduction through metal nanowire contactsLin, Yong-Han; Chiu, Shao-Pin; Lin, Juhn-Jong; 電子物理學系; 物理研究所; Department of Electrophysics; Institute of Physics
13-Dec-2012Time-dependent universal conductance fluctuations in IrO2 nanowiresLin, Yong-Han; Wang, Lu-Yao; Lin, Juhn-Jong; 電子物理學系; 物理研究所; Department of Electrophysics; Institute of Physics
Showing results 1 to 11 of 11