Browsing by Author Liou, BW
Showing results 1 to 5 of 5
| Issue Date | Title | Author(s) |
| 1-May-1999 | Applications of total reflection X-ray fluorescence to analysis of VLSI micro contamination | Liou, BW; Lee, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-Apr-2000 | Characteristics of high breakdown voltage Schottky barrier diodes using p(+)-polycrystalline-silicon diffused-guard-ring | Liou, BW; Lee, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-Jun-1997 | Hydrogen and oxygen plasma effects on polycrystalline silicon thin films of various thicknesses | Liou, BW; Lee, CL; Lei, TF; Wu, YH; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 8-Dec-2000 | Plasma effects of fluorine implantation on As+-doped polycrystalline silicon thin films of various thicknesses | Liou, BW; Lee, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 1-Dec-1999 | Variations of X-ray spectrum in total reflection X-ray fluorescence (TXRF) analysis with respect to Si wafer crystal orientation for different incident angles | Liou, BW; Lee, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
