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Issue DateTitleAuthor(s)
1-Jan-2020Characteristic Simulation of Hybrid Multilayer Junctionless Field Effect Transistors with Negative Capacitance EffectMa, Jun; Liu, Chien; Liu, Wei-Dong; Hung, Yu-Wen; Fan, Yu-Chi; Hsu, Hsiao-Hsuan; Zheng, Zhi-Wei; Cheng, Chun-Hu; 電子物理學系; Department of Electrophysics
1-Jun-2012Experimental Verification of RF Stress Effect on Cascode Class-E PA Performance and ReliabilityYuan, Jiann-Shiun; Yen, Hsuan-Der; Chen, Shuyu; Wang, Ruey-Lue; Huang, Guo-Wei; Juang, Ying-Zong; Tu, Chih-Ho; Yeh, Wen-Kuan; Ma, Jun; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Dec-2019Gamma-Ray Irradiation Effect on Ferroelectric Devices with Hafnium Aluminum OxidesLiu, Chien; Tung, Yi-Chun; Wu, Tian-Li; Cheng, Chun-Hu; Tseng, Chih-Yang; Chen, Hsuan-Han; Chen, Hsi-Han; Ma, Jun; Lin, Chien-Liang; Zheng, Zhi-Wei; Chou, Wu-Ching; Hsu, Hsiao-Hsuan; 光電系統研究所; 電子物理學系; 國際半導體學院; Institute of Photonic System; Department of Electrophysics; International College of Semiconductor Technology
Showing results 1 to 3 of 3