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Browsing by Author Pan, Samuel C.

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Issue DateTitleAuthor(s)
2007Impact of self-heating effect on hot carrier degradation in high-voltage LDMOSCheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-May-2011A Novel Array-Based Test Methodology for Local Process Variation MonitoringLuo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael Shien-Yang; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Fisher, Philip A.; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009A novel array-based test methodology for local process variation monitoringLuo, Tseng-Chin; Chao, Mango C. -T.; Wu, Michael S. -Y.; Li, Kuo-Tsai; Hsia, Chin C.; Tseng, Huan-Chi; Huang, Chuen-Uan; Chang, Yuan-Yao; Pan, Samuel C.; Young, Konrad K. -L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2006Physics and characterization of various hot-carrier degradation modes in LDMOS by using a three-region charge-pumping techniqueCheng, Chih-Chang; Lin, J. F.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Samuel C.; Hsu, S. L.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 1 to 4 of 4