| 公開日期 | 標題 | 作者 |
| 1-六月-2004 | Accuracy analysis of the estimated process treld based onS(pk) | Pearn, WL; Chuang, CC; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-三月-2003 | An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators | Pearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-八月-2003 | An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003) | Pearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-十一月-2004 | Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions | Pearn, WL; Chung, SH; Yang, MH; Chen, YH; 交大名義發表; National Chiao Tung University |
| 18-四月-2005 | Analytic network process (ANP) approach for product mix planning in semiconductor fabricator | Chung, SH; Lee, AHI; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-十一月-1997 | An application of non-normal process capability indices | Chen, KS; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 20-十月-2005 | Approximate solutions for the Maximum Benefit Chinese Postman Problem | Pearn, WL; Chiu, WC; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-六月-2005 | Assessing process performance based on the incapability index C-pp | Lin, PC; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1997 | The asymptotic distribution of the estimated process capability index (C)over-tilde(pk) | Chen, SM; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 16-九月-2005 | A Bayesian approach for assessing process precision based on multiple samples | Pearn, WL; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-十月-2005 | A Bayesian approach to obtain a lower bound for the C-pm capability index | Lin, GH; Pearn, WL; Yang, YS; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1996 | A Bayesian-like estimator of C-pk | Pearn, WL; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 2003 | A Bayesian-like estimator of the process capability index C-pmk | Pearn, WL; Lin, GH; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 2005 | Bootstrap approach for estimating process quality yield with application to light emitting diodes | Pearn, WL; Chang, YC; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 2004 | The C ''(pk) index for asymmetric tolerances: Implications and inference | Pearn, WL; Lin, PC; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-五月-2004 | C-pm MPPAC for manufacturing quality control applied to precision voltage reference process | Pearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-七月-2004 | C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process | Pearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-十二月-1997 | Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturing | Pearn, WL; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-九月-2001 | Capability indices for processes with asymmetric tolerances | Chen, KS; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 2005 | Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturing | Pearn, WL; Wu, CW; Wang, KH; 工業工程與管理學系; Department of Industrial Engineering and Management |
