1. You are Here：

Browsing by Author Pearn, WL

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:  
Showing results 1 to 20 of 84  next >
Issue DateTitleAuthor(s)
1-Jun-2004Accuracy analysis of the estimated process treld based onS(pk)Pearn, WL; Chuang, CC; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Mar-2003An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulatorsPearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Aug-2003An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003)Pearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Nov-2004Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictionsPearn, WL; Chung, SH; Yang, MH; Chen, YH; 交大名義發表; National Chiao Tung University
18-Apr-2005Analytic network process (ANP) approach for product mix planning in semiconductor fabricatorChung, SH; Lee, AHI; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Nov-1997An application of non-normal process capability indicesChen, KS; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
20-Oct-2005Approximate solutions for the Maximum Benefit Chinese Postman ProblemPearn, WL; Chiu, WC; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Jun-2005Assessing process performance based on the incapability index C-ppLin, PC; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
1997The asymptotic distribution of the estimated process capability index (C)over-tilde(pk)Chen, SM; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
16-Sep-2005A Bayesian approach for assessing process precision based on multiple samplesPearn, WL; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Oct-2005A Bayesian approach to obtain a lower bound for the C-pm capability indexLin, GH; Pearn, WL; Yang, YS; 工業工程與管理學系; Department of Industrial Engineering and Management
1996A Bayesian-like estimator of C-pkPearn, WL; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
2003A Bayesian-like estimator of the process capability index C-pmkPearn, WL; Lin, GH; 工業工程與管理學系; Department of Industrial Engineering and Management
2005Bootstrap approach for estimating process quality yield with application to light emitting diodesPearn, WL; Chang, YC; Wu, CW; 工業工程與管理學系; Department of Industrial Engineering and Management
2004The C ''(pk) index for asymmetric tolerances: Implications and inferencePearn, WL; Lin, PC; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
1-May-2004C-pm MPPAC for manufacturing quality control applied to precision voltage reference processPearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Jul-2004C-pm MPPAC for manufacturing quality control applied to the precision voltage reference processPearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Dec-1997Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturingPearn, WL; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Sep-2001Capability indices for processes with asymmetric tolerancesChen, KS; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
2005Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturingPearn, WL; Wu, CW; Wang, KH; 工業工程與管理學系; Department of Industrial Engineering and Management
Showing results 1 to 20 of 84  next >