瀏覽 的方式： 作者 Shen, Chin-Yen
顯示 1 到 1 筆資料，總共 1 筆
| 公開日期 | 標題 | 作者 |
| 2009 | Reliability Study of MANOS with and without a SiO2 Buffer Layer and BE-MANOS Charge-Trapping NAND Flash Devices | Liao, Chien-Wei; Lai, Sheng-Chih; Lue, Hang-Ting; Yang, Ming-Jui; Shen, Chin-Yen; Lue, Yi-Hsien; Huang, Yu-Fong; Hsieh, Jung-Yu; Wang, Szu-Yu; Luo, Guang-Li; Chien, Chao-Hsin; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan; 電機學院; College of Electrical and Computer Engineering |
