Browsing by Author Shiau, WT
Showing results 1 to 3 of 3
| Issue Date | Title | Author(s) |
| 2004 | Low leakage reliability characterization methodology for advanced CMOS with gate oxide in the 1nm range | Chung, SS; Feng, HJ; Hsieh, YS; Liu, A; Lin, WM; Chen, DF; Ho, JH; Huang, KT; Yang, CK; Cheng, O; Sheng, YC; Wu, DY; Shiau, WT; Chien, SC; Liao, K; Sun, SW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2005 | A new insight into the degradation mechanisms of various mobility-enhanced CMOS devices with different substrate engineering | Chung, SS; Liu, YR; Wu, SJ; Lai, CS; Liu, YC; Chen, DF; Lin, HS; Shiau, WT; Tsai, CT; Chien, SC; Sun, SW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
| 2005 | A new observation of the germanium outdiffusion effect on the hot carrier and NBTI reliabilities in sub-100nm technology strained-Si/SiGe CMOS devices | Chung, SS; Liu, YR; Yeh, CF; Wu, SR; Lai, CS; Chang, TY; Ho, JH; Liu, CY; Huang, CT; Tsai, CT; Shiau, WT; Sun, SW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics |
