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Browsing by Author Shu, MH
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Showing results 1 to 10 of 10
Issue Date
Title
Author(s)
1-Mar-2003
An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators
Pearn, WL
;
Shu, MH
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
1-Aug-2003
An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003)
Pearn, WL
;
Shu, MH
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
1-May-2004
C-pm MPPAC for manufacturing quality control applied to precision voltage reference process
Pearn, WL
;
Shu, MH
;
Hsu, BM
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
1-Jul-2004
C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process
Pearn, WL
;
Shu, MH
;
Hsu, BM
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
15-Jun-2004
Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance
Pearn, WL
;
Shu, MH
;
Hsu, BM
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
15-Oct-2003
Lower confidence bounds with sample size information for C-pm applied to production yield assurance
Pearn, WL
;
Shu, MH
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
1-Jun-2003
Manufacturing capability control for multiple power-distribution switch processes based on modified C-pk MPPAC
Pearn, WL
;
Shu, MH
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
1-Jan-2004
Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process
Pearn, WL
;
Shu, MH
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
15-Jun-2005
Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C-pmk
Pearn, WL
;
Shu, MH
;
Hsu, BM
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
1-Dec-2005
Testing process capability based on C-pm in the presence of random measurement errors
Pearn, WL
;
Shu, MH
;
Hsu, BM
;
工業工程與管理學系
;
Department of Industrial Engineering and Management
