瀏覽 的方式： 作者 Shu, MH
顯示 1 到 10 筆資料，總共 10 筆
| 公開日期 | 標題 | 作者 |
| 1-三月-2003 | An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators | Pearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-八月-2003 | An algorithm for calculating the lower confidence bounds of C-PU and C-PL with application to low-drop-out linear regulators (vol 43, pg 495, 2003) | Pearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-五月-2004 | C-pm MPPAC for manufacturing quality control applied to precision voltage reference process | Pearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-七月-2004 | C-pm MPPAC for manufacturing quality control applied to the precision voltage reference process | Pearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 15-六月-2004 | Lower confidence bounds for C-PU and C-PL based on multiple samples with application to production yield assurance | Pearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 15-十月-2003 | Lower confidence bounds with sample size information for C-pm applied to production yield assurance | Pearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-六月-2003 | Manufacturing capability control for multiple power-distribution switch processes based on modified C-pk MPPAC | Pearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-一月-2004 | Measuring manufacturing capability based on lower confidence bounds of C-pmk applied to current transmitter process | Pearn, WL; Shu, MH; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 15-六月-2005 | Monitoring manufacturing quality for multiple Li-BPIC processes based on capability index C-pmk | Pearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management |
| 1-十二月-2005 | Testing process capability based on C-pm in the presence of random measurement errors | Pearn, WL; Shu, MH; Hsu, BM; 工業工程與管理學系; Department of Industrial Engineering and Management |
